Engineering Forensics using the SEM    3 s.h

Catalog description

Use of Scanning Electron Microscope (SEM) for forensic and failure analysis investigations. Individual term projects using the stereomicroscope, preparing SEM samples, taking SEM photomicrographs, and using the energy dispersive x-ray analyzer. Two hours lecture and three hours lab per week. Prereq.: MECH 2606 or MTEN 2606 .