EE 7540
VLSI Testing and Design for Testability
Wright State University-Main Campus · UGRD · Fall 2026
1 section
Catalog description
Design for testability of VLSI circuits. Topics include importance of testing, conventional test methods, built-in test, CAD tools for evaluating testability, test pattern generators and compressors; and test for mixed-signal systems and systems-on-a-chip (SOC).
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001
Availability not recently verifiedClass #wright_main_campus-EE7540Fall 2026UGRD3 credits
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