CEG 7570
Pattern Recognition
Wright State University-Main Campus · UGRD · Fall 2026
1 section
Catalog description
Supervised and unsupervised classification are covered, including feature extraction, feature selection, distance measures, sequential clustering, hierarchical clustering, Bayesian decision theory, parameter estimation, and applications of pattern recognition
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001
Availability not recently verifiedClass #wright_main_campus-CEG7570Fall 2026UGRD3 credits
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