Electronic Test and Measurement

Catalog description

Introduction to the principle of metrology and modern electronic testing and measurement. Topics covered include types of testing and design-for-testability techniques such as scan-path, boundary scan and built-in-self test. The understanding of theoretical concepts of testing related subjects are augmented through extensive lab projects using Verilog and Labview tools. Prerequisite: a minimum grade of 2.0 in B EE 271. Offered: Sp.