EE 4553

VLSI Testing. (2-3) 3 Credit Hours

University of Texas at San Antonio · UGRD · Fall 2026

1 section

Catalog description

Prerequisite: EE 2583 (or EE 3463 in previous catalogs). Faults modeling and simulation; stuck at faults, bridging faults, and functional testing; self-testing concepts; standard and test patterns; device and system testing; and design for testability. This course has Differential Tuition.

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Class #texas_san_antonio-2676Fall 2026UGRD

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Instructor: Staff

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