Microstruct & Microchem Charac

Catalog description

The application of modern instrumentation and techniques to structural characterization problems. Both theory and operation will be stressed. Optical microscopy, X-Ray analysis, electron microscopy (TEM-SEM), surface characterization, optical emission spectroscopy will be included. Real-world examples of the use of characterization equipment will be given based on my experience in the semiconductor industry. The equipment we will cover in this class are the tools you will most likely use to perform your job whether you decide to pursue an academic career or a career in industry.