Transmission Electron Microsc

Catalog description

The lectures will cover sample preparation techniques, construction and working of TEM, reciprocal space, Ewald's sphere, indexing diffraction patterns, convergent beam techniques, high-resolution TEM, and introduction to defect analysis, scanning TEM or STEM, analytical and in-situ techniques. The lab will cover beam alignments, recording diffraction patterns and centered dark-field images, high-resolution imaging, bright-field dislocation imaging, and weak-beam dark-field imaging. Keywords: Microscopy, Electronic Characterization