INSTRUMENTATION FOR MATERIALS CHARACTERIZATION.

Catalog description

This course is composed of two components: lecture and laboratory for several materials characterization techniques. The lecture part includes the instruction of basic principles and theories behind AFM, Raman, FT-IR, XRD, SEM, TEM and spectroscopic techniques. Students in the class are divided into small groups for the laboratory part (4-5 people per group) so that students can gain hand-on experiences on various characterization techniques by operating associated equipment.