EE 5342
SEMICONDUCTOR DEVICE MODELING AND CHARACTERIZATION.
University of Texas at Arlington · UGRD · Fall 2026
1 section
Catalog description
Device models and characterization procedures for the pn junction and Schottky diodes, the BJT, JFET, MOSFET, HBT, and optical sources and detectors. SPICE derived and higher level circuit simulator models will be presented. Prerequisite: EE 5340 or EE 5341.
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001
Availability not recently verifiedClass #texas_arlington_new-2560Fall 2026UGRD3 credits
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