CSE 772
Testing of Digital Circuits
Syracuse University · UGRD · Fall 2026
1 section
Catalog description
Physical circuit failures and fault models. Test generation algorithms. Fault stimulation and fault coverage. Random pattern testing. Sequential circuit testing. Test application and response processing techniques. Memory, PLA, and function testing. Design for test.
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001
Availability not recently verifiedClass #syracuse-CSE772Fall 2026UGRD3 credits
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