EE 658
Diagnosis and Design of Reliable Digital Systems
University of Southern California · UGRD · Fall 2026
1 section1 open now
Catalog description
Fault models; test generation; fault simulation; self-checking and self-testing circuits; design for testability; fault tolerant design techniques; case studies; search techniques; memory testing.
Sections
Current meeting, instructor, credit, and enrollment details
C
7 openSeats: 53/60 seats Last recorded: Aug 8, 2026, 10:16 PMClass #30787Fall 2026UGRD4.0 credits
7 available53 enrolled60 capacity
- Days & times
- S 12:00-15:50
- Meeting dates
- —
- Location
- —
- Instructor
- Moe Tabar
Details checked 9 hours agoSeats checked 9 hours ago
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