Advanced Nanomaterials Characterization Methods

Catalog description

This course provides a comprehensive overview of theoretical principles, instrumentation, applications, and practical concepts related to advanced techniques for characterization of nanoscale materials and systems. Topics include: diffraction theory, low-energy and reflection high-energy electron diffraction, X-ray diffraction, X-ray reflectivity; analytical scanning electron microscopy techniques including electron beam-induced current, energy-/wavelength-dispersive X-ray spectrometry, and electron backscatter diffraction; analytical transmission electron microscopy techniques including selected-area and convergent-beam electron diffraction, electron energy-loss spectroscopy, energy-filtered imaging, and electron holography; focused ion beam-based characterization and patterning; spectroscopic techniques including photo-, electro-, and cathodo-luminescence spectroscopy, Raman spectroscopy, and Auger electron spectroscopy; scan probe microscopy techniques including atomic force, magnetic force, photo-induced force, Kelvin probe force, scanning tunneling, scanning near-field optical, and scanning microwave impedance microscopy; and ion beam techniques including secondary ion mass spectrometry and local electrode atom probe tomography. The above techniques will be explored with the aid of case studies from the current literature. Lecture content will be reinforced by active demonstrations conducted in various labs at RIT and University of Rochester.