Testing of Focal Plane Arrays

Catalog description

This course is an introduction to the techniques used for the testing of solid state imaging detectors such as CCDs (charge coupled device), CMOS, (complementary metal oxide semiconductor), and infrared arrays. Focal plane array users in industry, government and academia need to ensure that key operating parameters for such devices either fall within an operating range or that the limitation to the performance is understood. This is a hands-on course where the students will measure the performance parameters of a particular camera in detail.