Advanced Synchrotron and Electron Characterization of Materials

Catalog description

This course provides an overview of the latest techniques for the characterization of materials with synchrotron x-rays and electron microscopy. Emphasis is placed on understanding of x-ray and electron interactions with matter, and how these may be exploited to characterize structure and chemistry at the nanometer to atomic scale. Prerequisite: Graduate students: Background in solid-state physics, crystallography and quantum mechanics is strongly recommended. Undergraduates: MSE 570.