Structure and Characterization of Materials

Catalog description

Atomic structure of materials and its determination using X-ray diffraction techniques. Introduction crystalline defects and microstructure. Characterizing and quantifying materials microstructure using optical and electron microscopy. Prereq: 2010, Physics 1250 or 1260, Math 1151 or 1161, and Chem 1210 or 1250; and enrollment as MatScEn-BS student; or permission of instructor. Not open to students with credit for both 341 and 342.