MSE 712

Scanning Electron Microscopy

North Carolina State University · UGRD · Fall 2026

1 section

Catalog description

Electron optics, sources and detectors. Beam specimen interactions, secondary and backscattered electrons, and EDS. Resolution limits, experimental conditions, related techniques, beam-induced damage and materials modifications.

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Class #north_carolina_state-3707Fall 2026UGRD

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Instructor: Staff

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