Analysis I

Catalog description

Metric spaces: contraction mapping principle, Tietze extension theorem, Ascoli-Arzela lemma, Baire category theorem, Stone-Weierstrass theorem, LP spaces. Banach spaces: linear operators, Hahn-Banach theorem, open mapping and closed graph theorems. Hilbert spaces: projection theorem, Riesz representation theorem, Lax-Milgram theorem, complete orthonormal sets.