Surface Character Techniques

Catalog description

The course covers scientific principles, instrumentation, and data analysis for several surface characterization techniques for chemical engineering systems. This course also addresses recent research papers regarding their applications. The techniques to be covered include surface topography (profilometers, atomic force microscopy, etc.), spectroscopy (UV-Vis absorption spectroscopy, Fourier transform infrared spectroscopy, Raman spectroscopy, etc.), microscopy (scanning electron microscopy and transmission electron microscopy), X-ray scattering (grazing incidence X-ray scattering, near edge X-ray absorption fine structure, etc.), and relevant advanced techniques.