Characterization of Solids. 3 credits, 3 contact hours

Catalog description

Current methods for characterizing the chemical composition, crystallographic structure, electrical mapping, and morphology of solid materials. Principles and application of Auger Electron Spectroscopy (AES), Secondary Ion Mass Spectroscopy (SIMS), X-ray Photoelectron Spectroscopy (XPS), X-ray Emission Spectroscopy (XES), and Rutherford Backscattering Spectroscopy (RBS) for chemical analysis, X-ray Diffraction (XRD) and electron diffraction for crystallographic analysis, Electron Beam Induced Current (EBIC) microscopy, voltage contrast microscopy, Cathodoluminescence for electrical mapping, and Atomic Force Microscopy (AFM), Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM) and Nomarski interference contrast microscopy (DIC) for morphology.