Nano-scale Characterization of Materials. 3 credits, 3 contact hours

Catalog description

The course presents the basics of nanotechnology and the principles and application of advanced instrumentation for the characterization of nanostructures. Topics include atomic force microscopy; near-field optics, dielectric spectroscopy, and light scattering. The significant component of the course is laboratory work at the W. M. Keck Foundation Laboratory and research project.