ECEN 417
SEMICONDUCTOR FUNDAMENTALS II
University of Nebraska at Omaha · UGRD · Fall 2026
1 section
Catalog description
Analysis of BJT's and MOSFET's from a first principle materials viewpoint. Statics and dynamic analysis and characterization. (Cross-listed with ECEN 817 )
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001
Availability not recently verifiedClass #nebraska_omaha-ECEN417Fall 2026UGRD3 credits
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