Scanning Electron Microscopy

Catalog description

An introduction to microsurface analysis using scanning electron microscopy and X-ray microanalysis. Theoretical considerations and laboratory procedures involve both techniques but the major emphasis will be on generation of secondary electron images. Some attention is devoted to backscattered electron imaging, X-ray mapping, stereo pair imaging, and related image processing techniques. May be taught concurrently with BMS 614. Cannot receive credit for both BMS 514 and BMS 614. Prerequisite: 60 hours.