Atomistic Materials Analytics

Catalog description

(same as CMP_SC 8615 , CH_ENG 8615 , BIOL_EN 8615 DATA_SCI 8615 , ECE 8615 , MAE 8615 ). Introduction to the principles of materials characterization and analysis leading to information extraction from experimental and computational data sets. Examines theoretical and practical issues associated with understanding the relationships between atomic/molecular structure and material properties. Describes encoding and visualizing atomic structure information. Measurement techniques covered include Ultraviolet-Visible (UV-Vis) spectroscopy, (Fourier Transform) Infrared Spectroscopy (FTIR), X-ray diffraction (XRD), and electronic conductivity. Covers standard data processing techniques, including sparse vs. abundant data, preprocessing and normalization, fixed length vs. variable length data, heterogeneous data streams, feature extraction, and the role of simulated data. Graded on A-F basis only. Credit Hour s : 3 Prerequisites: DATA_SCI 7010 , DATA_SCI 8010 , and Instructor consent