Advanced VLSI Design

Catalog description

Following an introduction on the design and analysis of digital CMOS VLSI circuits and systems, this course covers advanced topics such as gate sizing, transmission gate logic design, interconnect design, delay optimization, clock networks and power integrity challenges. Then the course focuses on VLSI Testing issues and covers subjects such as fault modeling, stuck at faults, transistor stuck on/open faults, controllability and observability measures, testability techniques, built-in self-testing, pseudo-random tests, IDDQ testing, alternative testing methodologies such as IBM Picosecond Light emission testing.