Testing of Advanced VLSI Circuits

Catalog description

Following an introduction on the course design and analysis of digital COMS VLSI, this course covers important concepts of CMOS- based digital system design and testing. The first part of the course introduces basics on gate sizing, transmission, gate logic design, interconnect delay optimization, clock networks and power integrity challenges. The course then introduces VLSI testing issues. Students will learn how to use test sequences for stuck at faults, transistor stuck on/open faults for simple circuits and describe controllability and observability measures. The course will then study testability and pseudorandom test techniques. Introduction to alternative testing, methodologies such as IDDQ and IBMs picosecond light emission testing will also be given.