MNT 108
Semiconductor Statistical Process Control (SPC)
Estrella Mountain Community College · UGRD · Fall 2026
1 section
Catalog description
Overview of fundamental statistical process control concepts and methods with emphasis on practical application in semiconductor manufacturing. Focus on reading, interpreting, and monitoring control charts rather than complex statistical calculations. Introduction to Six Sigma methodologies, waste identification, and quality system implementation for manufacturing technicians. Prerequisites: None.
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001
Availability not recently verifiedClass #estrella_mountain-4094Fall 2026UGRD1 credits
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