ECE 538
VLSI System Testing
Duke University · UGRD · Fall 2026
1 section
Catalog description
Fault modeling, fault simulation, test generation algorithms, testability measures, design for testability, scan design, built-in self-test, system-on-a-chip testing, memory testing. Prerequisite: Electrical and Computer Engineering 350L or equivalent.
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Availability not recently verifiedClass #duke-ECE538Fall 2026UGRD3 credits
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