MSE 6720
Advanced X-ray Characterization
Cornell University · UGRD · Fall 2026
Catalog description
Graduate-level introduction to coherent x-ray scattering and imaging in the context of nanoscale phenomena in metals, ceramics, polymers, and composites. The course focuses on in-situ x-ray characterization of functional materials through using the ability of novel x-ray sources to generate laser-like x-ray beams. Novel sources include recently build or upgraded x-ray synchrotrons (e.g., CHESS), table-top soft x-ray lasers, and x-ray free-electron lasers. Specific topics include coherence of x-ray beams, coherent x-ray imaging, x-ray cross correlation spectroscopy, resonant x-ray diffraction, in-situ x-ray characterization, ultrafast x-ray measurements, and the overview of existing x-ray sources and x-ray focusing techniques.
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