EECS E4321

DIGITAL VLSI CIRCUITS

Columbia University in the City of New York · UGRD · Fall 2026

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Design and analysis of high speed logic and memory. Digital CMOS and BiCMOS device modeling. Integrated circuit fabrication and layout. Interconnect and parasitic elements. Static and dynamic techniques. Worst-case design. Heat removal and I/O. Yield and circuit reliability. Logic gates, pass logic, latches, PLAs, ROMs, RAMs, receivers, drivers, repeaters, sense amplifiers

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Class #columbia_in_city_new_york-EECSE4321Fall 2026UGRD3.00 credits
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