Analytical Methods in Materials Science

Catalog description

Microcharacterization techniques of materials science and engineering: SPM (scanning probe microscopy), SEM (scanning electron microscopy), FIB (focused ion beam) techniques, SIMS (secondary ion mass spectrometry), EPMA (electron probe microanalysis), XPS (X-ray photoelectron spectrometry), and AES (Auger electron spectrometry), ESCA (electron spectrometry for chemical analysis). The course includes theory, application examples, and laboratory demonstrations.