EEE 238
Advanced VLSI Design-For-Test I.
California State University, Sacramento · UGRD · Fall 2026
1 section
Catalog description
Focus on integrated circuit design-for-test-techniques; semiconductor reliablity factors and screening; semiconductor fabrication processes, device physics and related performance limitations; quantifying cost/quality tradeoffs; IC manufacturing flows and high-accuracy parametric test methods.
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001
Availability not recently verifiedClass #california_state_sacramento-2210Fall 2026UGRD3 credits
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