ECE 255A
VLSI Testing Techniques
University of California Santa Barbara · UGRD · Fall 2026
1 section
Catalog description
Concepts, algorithms and design techniques for VLSI testing. Fault modeling, fault simulation, automatic test generation, design for testability, built-in self test, testability analysis, delay testing and synthesis for testability.
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Availability not recently verifiedClass #california_santa_barbara-2617Fall 2026UGRD
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