VLSI Testing

Catalog description

As VLSI continues to grow in its complexity, VLSI testing and design-for-testability are becoming more and more important issues. This course will cover VLSI testing techniques such as VLSI fault modeling (stuck-at-fault), automatic test generation, memory testing, design for testability (DFT), etc. VLSI scan testing and built-in self-test (BIST) will also be covered. Student will learn various VLSI testing strategies and how to design a testable VLSI circuit.