EEE 520

VLSI Design for Reliability

Arizona State University Digital Immersion · UGRD · Fall 2026

1 section

Catalog description

Modeling and design solutions for very large-scale integration (VLSI) reliability. Statistical design under static and dynamic variability. Aging effects and resilient design techniques. Radiation effects in VLSI.

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Class #arizona_digital_immersion-4697Fall 2026UGRD3 credits

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Instructor: Staff

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