Thin Film and Nanomaterials Characterization

Catalog description

Provides an overview of state-of-the-art techniques used for examining nanoscale thin films. The use of optical microscopy, scanning electron microscopy, scanning probe microscopy any other electron beam instruments coupled with specific detectors for monitoring secondary electron and x-ray signals to examine nanomaterials and compositions, created by the impact of electron beams with nanostructured films will be discussed. Prerequisite(s): N ENG/ I NEN 405 and N ENG/I NEN 406.